Centralized Research Facilities

The College of Engineering's centralized characterization facilities contain state-of-the-art materials characterization instruments, including environmental and variable pressure field-emission scanning electron microscopes with Energy Dispersive Spectroscopy (EDS) for elemental analysis, and Orientation Image Microscopy (OIM) for texture analysis; a new Transmission Electron Microscope (TEM) with STEM capability and TEM sample preparation equipment; a new dual beam FIB system for nanocharacterization and nanofabrication; a new femtosecond transient absorption and terahertz spectroscopy system; visible and ultraviolet Raman micro spectrometers with a total of 7 excitation wavelengths for non-destructive chemical and structural analysis and Surface Enhanced Raman (SERS); a Fourier Transform Infrared (FTIR) spectrometer with a microscope and full array of accessories; a Nanoindenter; an X-Ray Diffractometer (XRD). The Department of Materials Science and Engineering's high resolution X-ray microtomography (Micro CT) system is also located within this facility.

More details of these instruments, information how to access them and instrument usage rates can be found at http://crf.coe.drexel.edu/.

Equipment

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